Systems and Methods for Resistance Compensation in a Temperature Measurement Circuit
AssigneeTexas Instruments Incorporated
InventorsMarco A. Gardner, Jerry L. Dorrenbos
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AssigneeTexas Instruments Incorporated
InventorsMarco A. Gardner, Jerry L. Dorrenbos
Estimating the term…
Various systems and methods for temperature measurement are disclosed. For example, some embodiments of the present invention provide methods for temperature measurement that include exciting a provided transistor with at least four sequential input signals of different magnitudes. In response, the transistor exhibits a sequence of output signals corresponding to the four sequential input signals. The sequence of output signals is sensed using a different gain for each of the output signals included in the sequence of output signals, and the output signals included in the sequence of output signals are combined such that the combined output signals eliminates a resistance error. The combined output signals are then used to calculate a temperature of the transistor.
A method for resistance compensated temperature measurement, the method comprising:
A temperature measurement system, wherein the temperature measurement system comprises:
A method for performing temperature measurements, the method comprising:
Dependencies are inferred from the claim text.