# US 2008/0189575 A1 · Methods and apparatus for data analysis

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- Number: US 2008/0189575 A1
- Document ID: US20080189575A1
- Status: Published application
- Kind: A1
- Application number: 12/021,616
- Filed: 2008-01-29
- Published: 2008-08-07
- Earliest claimed: 2001-05-24
- Inventors: EMILIO MIGUELANEZ; Michael J. Scotl; Jacky Gorin; Paul Buxton; Paul Tabor
- Web page: https://patentgrep.com/patent/US20080189575A1

## CPC

- G06F 11/273: Tester hardware, i.e. output processing circuits {(G06F11/263 takes precedence)}
- G05B 23/0229: {knowledge based, e.g. expert systems; genetic algorithms}
- G05B 23/0278: {Qualitative, e.g. if-then rules; Fuzzy logic; Lookup tables; Symptomatic search; FMEA}
- H10P 74/23: {characterised by multiple measurements, corrections, marking or sorting processes}
- G05B 2219/1112: Bit addressing, handling
- G05B 2223/02: Indirect monitoring, e.g. monitoring production to detect faults of a system
- G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N)
- G05B: CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS (systems for controlling or regulating non-electric variables G05D; systems for regulating electric or magnetic variables G05F; control devices or systems insofar as characterised by mechanical features only G05G)
- H10P: GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10

## Abstract

A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components.

## Claims

### Claim 1

A test system, comprising:
a tester configured to test a set of components and generate test data for the set of components; and
a diagnostic system configured to receive the test data from the tester and automatically analyze the test data to identify a problem in a process for fabricating the components, wherein the diagnostic system is configured to recognize a pattern in the test data and match the recognized pattern with the problem.

### Claim 2

(canceled)

### Claim 3

(canceled)