# US 2008/0184583 A1 · Micrometer-based measuring system and method of using same > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2008/0184583 A1 - Document ID: US20080184583A1 - Status: Published application - Kind: A1 - Application number: 11/767,022 - Filed: 2007-06-22 - Published: 2008-08-07 - Earliest claimed: 2007-02-02 - Assignees: Shenzhen Futaihong Precision Industrial Co,.Ltd.; Sutech Trading Limited - Inventors: LEI LI; PING CHEN; YUN-FANG ZHAO; DONG LI; ZHI-LI CHEN; JUN JIANG - Web page: https://patentgrep.com/patent/US20080184583A1 ## CPC - G01B 3/18: Micrometers - G01B 5/02: for measuring length, width or thickness (G01B5/004, G01B5/08 take precedence) - G01B 5/063: {provided with a slide which may be moved along a vertical support by means of a micrometer screw} - G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ## Abstract A measuring system (100) includes a measuring instrument (10) and a processing device (20). The measuring instrument includes a base (12), a guide column (14), a sliding member (16), and a digital micrometer (18). The guide column is vertically attached to the base. The sliding member is moveably attached to the guide column. The digital micrometer is firmly fastened to the sliding member. The processing device is electronically connected with the digital micrometer. The processing device receives a measured value from the digital micrometer and diplays a testing result after processing the measured value. ## Claims ### Claim 1 A measuring system, comprising: a linear measuring instrument including a base, a guide column, a sliding member, and a digital micrometer, the guide column being vertically attached to the base, the sliding member being moveably attached to the guide column, the digital micrometer being firmly fastened to the sliding member; and a processing device electronically connecting with the digital micrometer; wherein the processing device receives a measured value from the digital micrometer and displays a testing result after processing the measured value. ### Claim 2 (depends on 1) The measuring system as claimed in claim 1, wherein the digital micrometer comprises a testing column and a gear, and the testing column is moveable along an axis thereof via selectable rotation of the gear. ### Claim 3 (depends on 2) The measuring system as claimed in claim 2, wherein the digital micrometer further comprises a dial plate configured for indicating the measured value and an output interface configured for transmitting the measured value to the processing device. ### Claim 4 (depends on 3) The measuring system as claimed in claim 3, wherein the digital micrometer further includes a zero reset button. ### Claim 5 (depends on 1) The measuring system as claimed in claim 1, wherein a guide hole is defined in the sliding member, and the guide column is engaged with the guide hole. ### Claim 6 (depends on 5) The measuring system as claimed in claim 5, further comprising a fastening member, wherein the fastening member is firmly attached to the sliding member, and the fastening member is flexibly attached to the guide column. ### Claim 7 (depends on 6) The measuring system as claimed in claim 6, wherein the fastening member has a through hole and a slot defined therein, and the aperture extends across the fastening member and permits the through hole to communicate with the ambient. ### Claim 8 (depends on 7) The measuring system as claimed in claim 7, wherein a bore is defined in the fastening member, the bore is divided into two parts by the aperture, and an adjusting screw is engaged with the bore to facilitate adjustment of the diameter of the through hole. ### Claim 9 (depends on 5) The measuring system as claimed in claim 5, wherein the sliding member includes a main block and an extending block, the extending block extends from a side surface of the sliding block, and the guide hole is defined in the extending block. ### Claim 10 (depends on 9) The measuring system as claimed in claim 9, wherein the digital micrometer further comprises a fixing portion, the extending block of the sliding member has a latching notch, the fixing portion is received in the latching notch, and the fixing portion is firmly attached to the sliding member by means of screws. ### Claim 11 (depends on 3) The measuring system as claimed in claim 3, wherein the processing device comprises a processor and a display, the processor electronically connects with the output interface of the digital micrometer, and the display electronically connects with the processor. ### Claim 12 (depends on 11) The measuring system as claimed in claim 11, wherein the processor includes a parameter-storing module, and the parameter-storing module stores reference data. ### Claim 13 A method for measuring, comprising the steps of: providing a linear measuring system, the measuring system including a measuring instrument and a processing device; inputting reference data into the processing device; measuring a workpiece using the measuring instrument so as to gain a testing dimension; and using the processing device to determine a relation between the testing dimension and the reference data so as to yield a testing result. ### Claim 14 (depends on 13) The method as claimed in claim 13, wherein a reference-standard block cooperates with a digital micrometer of the measuring instrument so as to establish a zero reference level. ### Claim 15 (depends on 13) The measuring system as claimed in claim 13, wherein the processing device subtracts the testing dimension from the height of the reference-standard block and compares the result with the reference data so as to yield a testing result. ### Claim 16 A measuring system, comprising: a linear measuring instrument including a base, a guide column, and a measuring assembly, the measuring assembly attached to the guide column, the measuring assembly including a digital micrometer moveably positioned above the base; and a processing device electronically connected with the digital micrometer; wherein the processing device receives a measured value from the digital micrometer and displays a testing result after processing the measured value. ### Claim 17 (depends on 15) The measuring system as claimed in claim 15, wherein the measuring assembly comprises a fastening member, and the fastening member is flexibly attached to the guide column. ### Claim 18 (depends on 17) The measuring system as claimed in claim 17, wherein the fastening member has a through hole and a slot defined therein, and the aperture extends across the fastening member and permits the through hole to communicate with the ambient. ### Claim 19 (depends on 18) The measuring system as claimed in claim 18, wherein a bore is defined in the fastening member, the bore is divided into two parts by the aperture, and an adjusting screw is engaged with the bore for selectably adjusting the diameter of the through hole.