Defective memory block remapping method and system, and memory device and processor-based system using same
AssigneeMicron Technology, Inc.
InventorsDean Nobunaga, Hanqing Li
Life of this patent
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AssigneeMicron Technology, Inc.
InventorsDean Nobunaga, Hanqing Li
Estimating the term…
A non-volatile memory device includes a block remapping system that offsets an input block address by the addresses of non-functional blocks to provide an output block address that is used to address the memory device. The system generates the output block addresses by, in effect, adding to the input block address the addresses of all non-functional blocks of memory that are between an initial address and the output block address. The system performs this function be comparing the input block address to the address of any defective block. If the address of the defective block is less than or equal to the input block address, the addresses of all defective blocks starting at the block address are added to the input block address. The system then iteratively performs this process using each output block address generated by the system in place of the input block address.
A method of addressing a memory device having blocks of non-volatile memory cells, the method comprising:
A method of addressing a memory device having blocks of non-volatile memory cells, the method comprising:
A block remapping system for a non-volatile memory device having memory cells arranged in blocks each of which is associated with a respective block address, the system comprising:
A block remapping system for a non-volatile memory device having memory cells arranged in blocks each of which is associated with a respective block address, the system comprising:
A non-volatile memory device, comprising:
A non-volatile memory device, comprising:
A processor-based system, comprising:
A processor-based system, comprising:
Dependencies are inferred from the claim text.