Process and device for the parameterization of measuring device
AssigneeSick Stegmann GmbH
InventorsJosef Siraky, Willibald Stobbe, Ralf Steinmann
Life of this patent
Estimating the term…
Abstract
In a measuring device, the measured data of a data recording component (10) are transmitted to an evaluating component via an output device (12). Parameters of the measuring device are stored in a memory (18). For the purpose of parameterization, parameters from the evaluating component can be stored in the memory (18) over a data cable for transmitting the measured data. To this end, the output device (12) for this data cable (Z) is operated at high impedance.
Claims8
Process for parameterization of a measuring device, in which the measured data of the measuring device are transmitted over at least one data cable, and in which parameters of the measuring device are stored in a memory,
- wherein
- the parameters are supplied to the memory over at least one of these data cables, and in supplying the parameters this data cable is operated at high impedance for a defined period of time relative to the transmission of measured values.
Device for the parameterization of a measuring device, exhibiting a data recording component (10) with an output device (12) for transmitting measured data from the data recording component (10) on data cables (A, B, Z), and exhibiting a memory (18) for storing parameters,
- wherein
- the parameters can be supplied to the memory over at least one data cable (Z, Z_) and the output device (12) can be switched into high-impedance operation at least for this data cable (Z, Z_) over a specific time period.
Dependencies are inferred from the claim text.