Method for classifying scientific materials such as silicate materials, polymer materials and/or nanomaterials
AssigneeBionorica AG
InventorsMichael A. Popp, Guenther Bonn, Christian W. Huck
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Abstract
A method is provided for characterizing a scientific material, such as a silicate material, a polymer material and/or nanomaterial. The method can include the steps of irradiating a measuring light of a predetermined wavelength range into material specimens, recording the measuring light reflected and/or reemitted by the material specimens, determining a ratio depending on the wave lengths of irradiated to detected measuring light (spectrum), and numerical-mathematical processing of spectral data of single material specimens for determining the characteristic features of the material specimens.
Claims23
A method for characterizing a scientific material such as a silicate material, a polymer material and/or nanomaterial comprising the following steps:
- a) irradiating a measuring light of a predetermined wavelength range into material specimens,
- b) recording of the measuring light reflected and/or reemitted by the material specimens,
- c) determining a ratio depending on the wave lengths of irradiated to detected measuring light (spectrum), and
- d) numerical-mathematical processing of spectral data of each material specimen for determining the characteristic features of the material specimens.
A method for characterizing a scientific material such as a silicate material, a polymer material and/or nanomaterial comprising the following steps:
- a) providing a plurality of material classes each with a plurality of calibration and material specimens per class with a plurality of known class-characteristics;
- b) irradiating a measuring light of a predetermined wavelength range into the material specimen;
- c) recording of the measuring light passed through, reflected, reemitted and/or scattered by the material specimens;
- d) determining a ratio depending on the wave lengths of irradiated to detected measuring light (spectrum) for each material specimen of a class;
- e) numerical-mathematical processing of spectral data of each material specimen;
- f) correlating the spectra of a majority of material specimens with a predetermined material class;
- g) creating a database with the processed spectral data with different material classes based on the material specimens measured of individual classes for calibration of a class correlation;
- h) repeating steps b) to e) at least once with at least one material sample with at least partially unknown characteristics;
- and
- i) determining the material classes to which the unknown material specimen is related, by means of a class correlation of the spectra measured using the created calibration database from step g).
Dependencies are inferred from the claim text.