Optical recording method on multilayer optical recording medium and optical recording apparatus
AssigneeTDK Corporation
InventorsTakashi Kikukawa, Koji Mishima, Hidetake Itoh
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Abstract
When there is a defect area in a specific recording layer, recording of information is continued to restrain reduction in a recording rate. In an optical recording method for recording information on a multilayer optical recording medium having a plurality of recording layers by irradiating the recording layer with a beam spot, when a defect area is detected while the information is recorded on a specific recording layer selected from the plurality of recording layers, an escape recording layer which is selected from among the other recording layers except for the specific recording layer is irradiated with the beam spot to continue recording the information.
Claims11
An optical recording method for recording information on a multilayer optical recording medium having a plurality of recording layers by irradiating the recording layer with a beam spot, wherein
- the information is recorded on a specific recording layer selected from the plurality of recording layers and when a defect area is detected during recording on the specific recording layer, an escape recording layer selected from among the other recording layers except for the specific recording layer is irradiated with the beam spot in order to continue recording the information.
An optical recording apparatus for a multilayer optical recording medium having a plurality of recording layers, the optical recording apparatus irradiating the multilayer optical recording medium with a beam spot in order to record information, the apparatus comprising:
- a recording section for recording the information by irradiating a specific recording layer of any of the recording layers with the beam spot;
- an inspection processing section for detecting a defect area with the use of reflected light of the beam spot of the recording section;
- and
- a focus shift processing section for shifting the focus of the beam spot to a recording layer which is different from the specific recording layer when the defect area is detected by an inspection process.
Dependencies are inferred from the claim text.