Internal supply-voltage generator of semiconductor memory device

Abstract

An internal supply-voltage generator of a semiconductor memory device, which can be used both in a high-voltage test mode and in a normal operation mode, maintains a constant response speed in the normal operation mode and includes; a comparator comparing a reference voltage with an internal supply voltage and outputting the result of the comparison through an output terminal; and a driver receiving an external supply voltage and outputting the internal supply voltage in response to the result of the comparisons wherein the internal supply voltage is directly fed back to the comparator, and the output terminal of the comparator is electrically disconnected from an operating voltage source of the comparator when the semiconductor memory device is in a high-voltage test mode.

Dependencies are inferred from the claim text.