Method and device for determining an operational lifetime of an integrated circuit device

An integrated circuit device comprising:

• a degradable test structure;
• a first external interface pin and a second external interface pin;
• a first conductive path coupling a first node of the degradable test structure and the first external interface pin;
• and
• a second conductive path coupling a second node of the degradable test structure and the second external interface pin.

A system comprising:

• an integrated circuit device comprising:
• a non-volatile memory device;
• a counter comprising an input configured to receive a first clock signal and an output to provide a count value;
• control logic configured to store the count value of the counter in the non-volatile memory;
• and
• means for accessing the count value from the non-volatile memory external from the integrated circuit device.