Probe, probe assembly and probe card for electrical testing

A probe assembly for electrical testing, the probe assembly comprising:

• a probe supporter comprising a first side surface and a first bottom surface;
• a plurality of insertion slots formed into at least one of the first side surface and the first bottom surface of the support;
• a plurality of probes, wherein a first one of the plurality of probes comprising:
• a first arm extending along the first side surface,
• a second arm connected to the first arm and extending along the first bottom surface,
• a first terminal portion formed at a distal end of the first arm and comprising a first tip configured to contact one of a plurality of electrode pads, wherein the first tip is not fixed to the electrode pad while contacting thereto, and
• a second terminal portion formed at a distal end of the second arm and comprising a second tip configured to contact an electrode of a testing object,
• wherein at least part of the first and second arms is inserted into a first one of the plurality of insertion slots.

A probe for use in a probe card for electrical testing, the probe comprising:

• a first arm extending generally in a first direction;
• a second arm connected to the first arm and extending generally in a second direction other than the first direction;
• a first terminal portion formed at a distal end of the first arm and comprising a first tip configured to form an electrical and physical contact with an electrode of a first device, wherein the first terminal portion is configured to allow the first tip to elastically move generally in the first direction;
• and
• a second terminal formed at a distal end of the second arm and comprising a second tip configured to form an electrical and physical contact with an electrode of a second device, wherein the second terminal portion is configured to allow the second tip to elastically move generally in the first direction.