Test apparatus

Abstract

There is provided a test apparatus that tests an electronic device. The test apparatus includes a socket board in which a socket for mounting thereon the electronic device is provided, and a test head that detachably holds the socket board and transmits source power to the electronic device via the socket board, the test head includes a first source power transmission line that transmits the source power to the socket board, a first bypass capacitor that is provided between the first source power transmission line and ground potential, and a switch that switches whether the first bypass capacitor is connected between the first source power transmission line and the ground potential, and the socket board includes a second source power transmission line that transmits the source power to the electronic device, and a second bypass capacitor that is fixedly connected between the second source power transmission line and the ground potential.

Dependencies are inferred from the claim text.