Semiconductor device
AssigneeHynix Semiconductor Inc.
InventorKie-Bong Ku
Life of this patent
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Abstract
A semiconductor device includes: a plurality of pins for receiving a plurality of external mount test signals; and a signal generating unit for generating a plurality of internal test mode signals in response the external mount test signals, wherein the semiconductor device enters into a mount test mode in response to the internal test mode signals for evaluating an operation of the semiconductor device mounted on an actual application device.
Claims25
A semiconductor device, comprising:
- a plurality of pins for receiving a plurality of external mount test signals;
- and
- a signal generating unit for generating a plurality of internal test mode signals in response to the external mount test signals,
- wherein the semiconductor device enters into a mount test mode in response to the internal test mode signals for evaluating an operation of the semiconductor device mounted on an actual application device.
The semiconductor device, comprising:
- a signal generating unit for generating a plurality of internal test mode signals in response to an external mount test signal;
- and
- a decoding unit for decoding the plurality of internal test mode signals,
- wherein the semiconductor device enters into a mount test mode in response to the internal test mode signals for evaluating an operation of the semiconductor device mounted on an actual application device.
A method for testing a semiconductor device, comprising:
- receiving a plurality of external mount test signals through a plurality of pins;
- comparing the mount test signals with a plurality of preset reference voltages having various voltage levels;
- and
- generating a plurality of internal test mode signals in response to the comparison result,
- wherein the semiconductor device enters into a mount test mode in response to the internal test mode signals for evaluating an operation of the semiconductor device mounted on an actual application device.
A method for testing a semiconductor device, comprising:
- receiving a plurality of external mount test signals;
- comparing the mount test signals with a plurality of preset reference voltages having various voltage levels;
- and
- generating a plurality of internal test mode signals in response to the comparison result,
- wherein the semiconductor device enters into a mount test mode in response to the internal test mode signals for evaluating an operation of the semiconductor device mounted on an actual application device.
A semiconductor device, comprising:
- a pin;
- a first comparator for comparing a signal from the pin and a first reference signal;
- and
- a second comparator for comparing the signal from the pin and a second reference signal.
Dependencies are inferred from the claim text.