Semiconductor device
OwnerYoshinori KUMURA, Tohru Ozaki +3inventors
InventorsYoshinori KUMURA, Tohru Ozaki, Susumu Shuto, Yoshiro Shimojo, Iwao Kunishima
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OwnerYoshinori KUMURA, Tohru Ozaki +3inventors
InventorsYoshinori KUMURA, Tohru Ozaki, Susumu Shuto, Yoshiro Shimojo, Iwao Kunishima
Estimating the term…
A semiconductor device comprising a ferroelectric capacitor having improved reliability is disclosed. According to one aspect of the present invention, it is provided a semiconductor device comprising a transistor formed on a semiconductor substrate, a ferroelectric capacitor formed above the transistor and comprising a lower electrode, a ferroelectric film and an upper electrode, a first hydrogen barrier film formed over the ferroelectric capacitor, an insulator formed over the first hydrogen barrier film, a contact plug disposed in the insulator and electrically connected with the upper electrode, a second hydrogen barrier film disposed between the contact plug and the insulator continuously, and a wiring connected with the contact plug.
A semiconductor device comprising:
A semiconductor device comprising:
Dependencies are inferred from the claim text.