Testing system for flip-type electronic device

A testing system for a flip-type electronic device, the flip-type electronic device comprising a cover and a main body, a hinge connecting with the cover and the main body, the testing system comprising:

• a plummer for locking the flip-type electronic device;
• an opening structure for opening the cover of the electronic device;
• a closing structure for closing the cover of the electronic device;
• and
• a control device including an optical fiber sensor for sensing the movement of the cover of the electronic device;
• wherein the opening structure and the closing structure are positioned next to the plummer, the control device being connected with the opening device and the closing device so as to control the opening device and the closing device.