Back to results
US 2008/0168315 A1Published application
Modified defect scan over sync mark/preamble field
AssigneeBroadcom Corporation, a California Corporation
InventorsJohn P. Mead, Bahjat Zafer
Life of this patent
Estimating the term…
Abstract
A technique to detect defects when reading a defect scan pattern stored on a disk in which the detected defects are processed differently depending on which region of a sector the defect is resident. In one implementation, a mask is used to identify the defects of different regions. By differentiating different regions within the sector for defect scan, sync mark and preamble fields may be treated as critical regions so that different defect scan properties may be attributed when performing the defect scan.
Claims20
An apparatus comprising:
- a defect detection module to detect defects when reading information stored on a storage medium;
- and
- a defect scan module coupled to receive defects detected in the defect detection module and to process the defects associated with a first region of the read information differently from defects associated with a second region of the read information to scan for defective portions of the storage medium.
An apparatus comprising:
- a defect detection module to detect defects when reading a defect scan pattern stored on a disk;
- and
- a defect scan module coupled to receive defects detected in the defect detection module and to process the defects associated with a first region of a read symbol differently from defects associated with a second region of the symbol to scan for defective sectors of the disk.
A method comprising:
- detecting defects when reading information stored on a storage medium during a defect scan;
- and
- processing the defects associated with a first region of the read information differently from defects associated with a second region of the read information to scan for defective portions of the storage medium.
Dependencies are inferred from the claim text.