System and method of measuring methylation of nucleic acids
AssigneeIllumina, Inc.
InventorsSemyon Kruglyak, Marina Bibikove, Eugene Chudin
Life of this patent
Estimating the term…
Abstract
The present embodiments relate to a system and method of measuring the methylation level of DNA. Some embodiments relate to a system and method of measuring methylation level of DNA with a gene array.
Claims29
A method of measuring the methylation level of DNA comprising:
- providing data representing the standard deviation of methylation measurements of DNA;
- determining the methylation level of at least one locus in a sample DNA;
- and
- comparing the methylation level of said at least one locus to said data to determine the standard deviation of said measurement.
The method of claim 11, further comprising identifying at least three regions from 0 to 1, determining the median of the methylation levels for each of said regions and fitting a parabola to said median for each of said regions.
A DNA methylation level detection system, comprising:
- a scanner for reading methylation levels for a plurality of loci in a sample DNA;
- and
- a first module configured to compare said methylation levels against data representing the standard deviation of methylation measurements of DNA.
A method of comparing the methylation level of DNA samples comprising:
- providing data representing the standard deviation of methylation measurements of DNA;
- determining the methylation level of at least one locus in a first sample DNA;
- determining the methylation level of said at least one locus in a second sample DNA;
- identifying the standard deviations of said methylation level of said at least one locus in said first sample DNA and in said second sample DNA from said data;
- and
- determining whether said methylation level of said at least one locus in said first sample DNA and in said second sample DNA are the same or different based on said standard deviations.
Dependencies are inferred from the claim text.