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AssigneesNational Institute of Advanced Industrial Science and Technology, SII NanoTechnology Inc.
InventorsHiroyuki Akinaga, Yasuyuki Semba, Hiroshi Yokoyama, Masatoshi Yasutake, Hiromi Kuramochi
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The present invention provides a probe for a scanning magnetic force microscope having a resolution sufficient to allow observation of a magnetic storage medium with 1200 kFCI or higher recording densities, a method for producing the probe, and a method for forming a ferromagnetic alloy film on a carbon nanotube. In the context of the present invention, the probe for a scanning magnetic force microscope comprises a carbon nanotube whose surface is at least in part coated with a ferromagnetic alloy film consisting of any one of a Co—Fe alloy and a Co—Ni alloy, wherein the arithmetic mean roughness (Ra 10 μm) of the surface of the ferromagnetic alloy film is controlled to 1.15 nm or less. A method for producing such probes for a scanning magnetic force microscope and a method for forming such a ferromagnetic alloy film on a carbon nanotube, so as to achieve such mean surface roughness by controlling the growth rate of the ferromagnetic alloy film within the range of 1.0 to 2.5 nm/min, is also disclosed.
A probe for a scanning magnetic force microscope comprising a carbon nanotube in which at least a portion of the surface of said nanotube is coated with a ferromagnetic alloy film selected from the group consisting of an Fe—Co alloy and an Fe—Ni alloy, further wherein the surface roughness (Ra(L=10 μm)) of said ferromagnetic alloy film is 1.15 nm or less.
A method for producing probes for a scanning magnetic force microscope comprising the steps of:
A method for forming a ferromagnetic alloy film on a carbon nanotube comprising the steps of:
Dependencies are inferred from the claim text.