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US 2008/0165360 A1Published application
Scanning beam device calibration
AssigneeUniversity of Washington
InventorRichard S. Johnston
Life of this patent
Estimating the term…
Abstract
Scanning beam device calibration using a calibration pattern is disclosed. In one aspect, a method may include acquiring an image of a calibration pattern using a scanning beam device. The acquired image may be compared with a representation of the calibration pattern. The scanning beam device may be calibrated based on the comparison. Software and apparatus to perform these and other calibration methods are also disclosed.
Claims30
A method comprising:
- acquiring an image of a calibration pattern using a scanning beam device;
- comparing the acquired image with a representation of the calibration pattern;
- and
- calibrating the scanning beam device based on the comparison.
1 more element
An article of manufacture comprising:
- a machine-accessible medium that provides instructions that if executed result in a machine performing operations including,
- comparing an image of a calibration pattern, which has been acquired with a scanning beam device, with a representation of the calibration pattern;
- and
- calibrating the scanning beam device based on the comparison.
1 more element
An apparatus comprising:
- a light source;
- a scanning optical element to receive light from the light source, the scanning optical element to scan a beam over a calibration pattern in a scan pattern;
- a photodetector to detect light backscattered from the calibration pattern at different times during the scan pattern;
- image generation logic to generate an image of the calibration pattern by representing the backscattered light detected at each of the different times at a corresponding expected position of the beam for a respective time;
- and
- comparison logic to compare the image with a representation of the calibration pattern.
3 more elements
Dependencies are inferred from the claim text.