Multilayer type test board assembly for high-precision inspection

A multilayer test board assembly for high-precision inspection, comprising:

• a plurality of test boards separated from each other according to their functions, having input/output signal terminals, and including adjacent first and second test boards, the second test board being positioned over the first test board, and the first board having a first section where first mounting devices sensitive to an influence of electrical signals are mounted and a second section where second mounting devices insensitive to an influence of electrical signals are mounted;
• spacers that arrange the test boards in parallel by spacing apart the test boards by predetermined intervals;
• connection cables connecting the input/output signal terminals of the test boards;
• and
• a signal shielding fence on a first ground line formed on the first test board and being in contact with a second ground line formed on a surface of the second test board facing the first ground line so as to protect the first mounting devices from electrical signals generated by the second mounting devices.