Sub-wavelength imaging and irradiation with entangled particles
OwnerJoachim Von Zanthier, Christoph Thiel +3inventors
InventorsJoachim Von Zanthier, Christoph Thiel, Enrique Solano, Thierry Bastin, Girish S. Agarwal
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Abstract
A method and apparatus for using one particle out of N particles for irradiating or investigating a target are provided. A radiation source with N incoherent emitters emits a radiation, and particles of said radiation are detected by using at least N−1 detectors located at N−1 different positions. A discriminator is adapted for identifying particle detection events on at least N−1 detectors within a predetermined time period from other particle detection events.
Claims47
A method for using one particle out of N particles for irradiating a target, comprising:
- providing a radiation source with N incoherent emitters;
- detecting radiation particles emitted from the radiation source by using N−1 detectors located at N−1 different positions;
- and
- opening a particle barrier based on an occurrence of single detections on all N−1 detectors within a predetermined time period to allow the one particle to reach the target.
An apparatus for irradiating a target, comprising:
- a radiation source having N incoherent emitters;
- N−1 particle detectors located at N−1 different positions;
- a discriminator adapted for identifying single particle detection events on all N−1 detectors within a predetermined time period from other particle detection events;
- and
- a particle barrier adapted to be opened based on the discriminator.
A method for using N particles for investigating an object, wherein N is greater than or equal to 2, comprising:
- fixing the position of the object;
- detecting particles of radiation emitted by the object by using N detectors located at N different positions;
- and
- discriminating single particle detections detected on all N detectors within a predetermined time period from other particle detection events.
An apparatus for investigating an object, comprising:
- a fixing unit for fixing the position of the object;
- N particle detectors located at N different positions for detecting particles of a radiation emitted by the object, wherein N is greater than or equal to 2;
- and
- a discriminator adapted for discriminating single particle detection events on all detectors within a predetermined time period from other particle detection events.
Dependencies are inferred from the claim text.