Apparatus and method for depositing and reflowing solder paste on a microelectronic workpiece
AssigneeMicron Technology, Inc.
InventorMichel Koopmans
Life of this patent
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AssigneeMicron Technology, Inc.
InventorMichel Koopmans
Estimating the term…
Stenciling machines and methods for forming solder balls on microelectronic workpieces are disclosed herein. In one embodiment, a method for depositing and reflowing solder paste on a microelectronic workpiece having a plurality of dies includes positioning a stencil having a plurality of apertures at least proximate to the workpiece. The method further includes placing discrete masses of solder paste into the apertures and reflowing the discrete masses of solder paste while the stencil is positioned at least proximate to the workpiece and while the discrete masses are in the apertures. In another embodiment of the invention, a stenciling machine for depositing and reflowing solder paste on the microelectronic workpiece includes a heater for reflowing the solder paste, a stencil having a plurality of apertures, and a controller operatively coupled to the heater and the stencil. The controller has a computer-readable medium containing instructions to perform the above-mentioned method.
1-60. (canceled)
A stenciling machine for depositing and reflowing solder paste on a microelectronic workpiece having a plurality of microelectronic dies, the machine comprising:
62-65. (canceled)
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70-76. (canceled)
A stenciling machine for depositing and reflowing solder paste on a wafer, the stenciling machine comprising:
80-84. (canceled)
A stenciling machine for depositing and reflowing solder paste on a microelectronic workpiece having a redistribution layer with bond-sites, the stenciling machine comprising:
A stenciling machine for depositing and reflowing solder paste on a microelectronic workpiece having a plurality of microelectronic dies and a redistribution layer with a dielectric layer over the dies and bond-sites coupled to the dies, the stenciling machine comprising:
Dependencies are inferred from the claim text.