Back to results
US 2008/0157076 A1Published application
Semiconductor device with test pads and pad connection unit
AssigneeSamsung Electronics Co., Ltd.
InventorWoo-Seop Jeong
Life of this patent
Estimating the term…
Abstract
A semiconductor device includes at least one first type of pad and at least one second type of pad having a different area from the first type of pad. A pad connection unit electrically couples the at least one second type of pad to an integrated circuit of the semiconductor device during a test mode, and disconnects the at least one second type of pad from the integrated circuit during a normal operating mode.
Claims20
A semiconductor device comprising:
- at least one first type of pad;
- at least one second type of pad having a different area from the first type of pad;
- and
- a pad connection unit for electrically coupling the at least one second type of pad to an integrated circuit of the semiconductor device during a predetermined operating mode.
1 more element
Dependencies are inferred from the claim text.