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US 2008/0156780 A1Published application
Substrate markings
OwnerSergei Voronov, Rose Mulligan +1inventors
InventorsSergei Voronov, Rose Mulligan, Sarita Evans
Life of this patent
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Abstract
Apparatus, systems, and methods are provided to generate markings on the side of a substrate. The markings represent information. In an embodiment, the information provided in the markings may be used to collect information during an assembly process.
Claims22
A method comprising:
- providing a substrate, the substrate having a surface on which to hold an integrated circuit, the substrate having a side at an angle to the surface such that the side defines a thickness of the substrate;
- and
- generating markings on the side of the substrate, the markings being representative of information.
A method including:
- decoding markings on a side of a substrate, the substrate having a surface on which to hold an integrated circuit, the side of the substrate being at an angle to the surface such that the side defines a thickness of the substrate, the markings being representative of information;
- analyzing results from decoding the markings;
- and
- storing data in a memory, the data correlated to decoding the markings and/or analyzing the results.
1 more element
An apparatus comprising:
- a die having at least one integrated circuit;
- and
- a substrate coupled to the die, the substrate having a surface on which to hold the die and a side at an angle to the surface such that the side defines a thickness of the substrate, the side having markings representative of information.
A system comprising:
- a laser to generate a laser beam;
- a galvo scanner to scan the laser beam along a side of a substrate, the substrate having a surface on which to hold an integrated circuit, the side of the substrate being a side at an angle to the surface such that the side defines a thickness of the substrate;
- and
- control circuitry to regulate the galvo scanner to generate markings on the side of the substrate, the markings representative of information.
1 more element
Dependencies are inferred from the claim text.