Micrometer-based measuring system and method of using same

A method for measuring, comprising the steps of:

• providing a measuring system, the measuring system including a measuring instrument and a processing device, the measuring instrument including a digital micrometer and a holding member, the holding member having a reference-standard surface formed thereon, the digital micrometer including a measuring shaft;
• inputting reference data into the processing device;
• setting a datum mark of the digital micrometer when the measuring shaft of the digital micrometer touches the reference-standard surface of the holding member;
• measuring a plurality points of an upper surface of a workpiece using the measuring instrument so as to gain a plurality of measured values;
• and
• using the processing device to deal with the measured values and determine a relation between the measured values and the reference data so as to yield a testing result.

A measuring system, comprising:

• a measuring instrument including a base, a guide column, a holding member and a measuring assembly, the measuring assembly attached to the guide column, the measuring assembly including a digital micrometer moveably positioned above the holding member, the holding member being positioned on the base and having a reference-standard surface formed thereon;
• and
• a processing device electronically connected with the digital micrometer;
• wherein the processing device receives measured values from the digital micrometer and displays a testing result after processing the measured values.