Electret condenser microphone and manufacturing method thereof
OwnerHirofumi Imanakainventor
Life of this patent
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Abstract
An electret condenser microphone includes a first electrode provided with an electret and a second electrode opposed to the first electrode with an air gap interposed. In manufacture of the electret condenser microphone, after degasification is performed on the inside of the air gap, water repellent finishing is performed on at least the inside of the air gap.
Claims9
A method for manufacturing an electret condenser microphone which includes a first electrode provided with an electret and a second electrode opposed to the first electrode with an air gap interposed, the method comprising the steps of:
- (a) performing degasification on the inside of the air gap;
- and
- (b) performing water repellent finishing on at least the inside of the air gap after the step (a).
An electret condenser microphone as an integrally formed electret condenser microphone, comprising:
- a first electrode provided with an electret and being capable of vibrating;
- a second electrode opposed to the first electrode with an air gap interposed;
- and
- an SiON film terminating with a silyl group, the SiON film covering at least respective parts of the surfaces of the first electrode and the second electrode which are exposed to the air gap.
A method for manufacturing an electret condenser microphone as an integrally formed electret condenser microphone including:
- a first electrode provided with an electret and being capable of vibrating;
- a second electrode opposed to the first electrode with an air gap interposed;
- and an SiN film covering at least respective parts of the surfaces of the first electrode and the second electrode which are exposed to the air gap, the method comprising the steps of:
- (a) performing degasification on the inside of the air gap;
- (b) forming an SiON film by oxidizing at least the surface of the SiN film after the step (a);
- and
- (c) performing silyl group substitution on at least the surface of the SiON film after the step (b).
Dependencies are inferred from the claim text.