Current perpendicular to plane (CPP) magnetoresistive sensor with improved pinned layer
AssigneeHitachi Global Storage Technologies
InventorsMatthew Joseph Carey, Jeffrey Robinson Childress, Stefan Maat
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AssigneeHitachi Global Storage Technologies
InventorsMatthew Joseph Carey, Jeffrey Robinson Childress, Stefan Maat
Estimating the term…
A current perpendicular to plane dual giant magnetoresistive sensor (dual CPP GMR sensor) that prevents spin torque noise while having high dR/R performance. The sensor has a design that maximizes the GMR effect (dR/R) by providing a pinned layer structure that maximizes the positive GMR contribution of the AP2 layer (or magnetic layer closest to the spacer layer) while minimizing the negative GMR contribution of the AP1 layer (or layer furthest from the spacer layer). The pinned layer structure includes an AP1 layer that includes a thin CoFe layer that is exchange coupled with an IrMn or IrMnCr AFM layer and has two or more Co layers with a spin blocking layer sandwiched between them. The use of the Co layers and the spin blocking layer in the AP1 layer minimizes the negative contribution of the AP1 layer. The AP2 layer has a plurality of CoFe layers with nano-layers such as Cu sandwiched between the CoFe layers. The nano-layers increase the already strong GMR effect provided by the CoFe layers, increasing the positive GMR effect from the AP2 layer.
A current perpendicular to plane dual giant magnetoresistive (CPP dual GMR) sensor, comprising:
A dual current perpendicular to plane giant magnetoresistive (Dual CPP GMR) sensor, comprising:
Dependencies are inferred from the claim text.