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US 2007/0192661 A1Published application
Automatic Test Equipment (ATE) Realized Through Sharing Same Memory Space by Instruction Data and Vector Data
OwnerEdward C. Chang, Meimei Chang +2inventors
InventorsEdward C. Chang, Meimei Chang, Deirdre McGlashan, Derek Chang
Life of this patent
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Abstract
An improved Automatic Test Equipment (ATE) in which Instruction Memory and a Vector Memory are combined together into a tester pattern memory in order to share the same memory space. As such, reducing the memory, size, and cost of the Automatic Test Equipment.
Claims2
An improved automatic test equipment (ATE), comprising:
- an instruction memory;
- and
- a vector memory;
- wherein, the instruction memory and the vector memory share the same memory space in ATE, thus forming a tester pattern memory and sharing information in the ATE system, as such reducing the tester size and cost of ATE.
1 more element
Dependencies are inferred from the claim text.