Process fault analyzer and system, program and method thereof
AssigneeOMRON Corporation
InventorsToshikazu Nakamura, Shigeru Obayashi, Kenichiro Hagiwara, Yoshikazu Aikawa
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AssigneeOMRON Corporation
InventorsToshikazu Nakamura, Shigeru Obayashi, Kenichiro Hagiwara, Yoshikazu Aikawa
Estimating the term…
A process fault analyzer, capable of analyzing fault caused due to a process performed by a plurality of process equipments, is provided. The analyzer includes: a plurality of process data storing units which store process data of the respective process equipments; a process data editing unit which calculates process characteristic quantity from various kinds of process data stored on the process data storing units; a plurality of process characteristic quantity data storing units which store process characteristic quantity of the respective process equipments calculated by the process data editing unit; a process characteristic quantity integration unit which accesses the process characteristic quantity data storing units, extracts process characteristic quantity of the same wafer, and integrates them; and a fault determination unit which determines presence or absence of fault according to the integrated process characteristic quantity data integrated by the process characteristic quantity integration unit.
A process fault analyzer for detecting fault in a process on a unit object according to process data obtained when the process is performed in a manufacturing system including a plurality of manufacturing devices, comprising:
A program for causing a computer to work as:
A process fault analyzing method to detect fault in a process on an unit object according to process data obtained when the process is performed in a manufacturing system including a plurality of manufacturing devices, comprising the steps of:
Dependencies are inferred from the claim text.