Fitting a neural prosthesis using impedance and electrode height

A neural stimulation system comprising:

• a plurality of electrodes suitable to stimulate neural tissue;
• means form measuring electrode height of at least one of said plurality of electrodes;
• and
• means for estimating a threshold of perception based on said electrode height.

A neural stimulation system comprising:

• a plurality of electrodes suitable to stimulate neural tissue;
• means form measuring impedance of at least one of said plurality of electrodes;
• means for communicating said impedance to an external device;
• and
• means in said external device for displaying said impedance to a user.

A method of determining proper placement of a neural stimulation electrode array comprising:

• placing an electrode array in proximity of neural tissue;
• measuring impedance across the electrode array;
• and
• determining, by the impedance, the proper placement of the electrode array.

A method of fitting a neural stimulation device comprising:

• providing a plurality of electrodes suitable to stimulate neural tissue;
• measuring impedance of at least one of said plurality of electrodes;
• and
• estimating a threshold of perception based on said impedance.

A method of fitting a neural stimulation system comprising:

• proving a plurality of electrodes suitable to stimulate neural tissue;
• measuring electrode height of at least one of said plurality of electrodes;
• and
• estimating a threshold of perception based on said electrode height.

A method of fitting and adjusting a neural stimulation device comprising:

• providing a plurality of electrodes suitable to stimulate neural tissue;
• measuring impedance of at least one of said plurality of electrodes;
• communicating said impedance to an external device;
• and
• displaying said impedance to a user.

A method of determining a defective electrode in a neural stimulation device comprising:

• providing a plurality of electrodes in proximity to neural tissue;
• stimulating neural tissue with a biphasic pulse on said plurality of electrodes;
• measuring voltage drops at a plurality of point during said biphasic pulse stimulation;
• calculating a function of said voltage drops for said plurality of electrode;
• comparing calculated results for said plurality of electrodes;
• and
• determining that electrodes defective if its calculated results deviates significantly from the mean/median of all calculated results.