Method and device for characterizing osi material

Abstract

Methods and apparatus for characterising OSI-materials provide for: introducing the material into a measurement cell; subjecting the material to a gas mixture containing oxygen; permitting a certain time or at certain time interval or intervals to elapse; measuring a defined volume part of the gas mixture with regard to its oxygen concentration using a measurement circuit, which together with the time component represents a characterisation of the OSI-material, wherein the OSI-material in the measurement cell is subjected to the gas mixture circulated in a closed reaction circuit, and the defined volume part is conveyed into a measurement circuit containing a gas, for the measurement of the oxygen concentration.

Dependencies are inferred from the claim text.