Silicon-on-insulator near infrared active pixel sensor array
AssigneeSharp Laboratories of America, Inc.
InventorsJong-Jan Lee, Jer-Shen Maa, Douglas Tweet, Sheng Hsu
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AssigneeSharp Laboratories of America, Inc.
InventorsJong-Jan Lee, Jer-Shen Maa, Douglas Tweet, Sheng Hsu
Estimating the term…
A method is provided for forming a near infrared (NIR) active pixel sensor array on a silicon-on-insulator (SOI) substrate. The method forms a first wafer comprising a high resistance first Si substrate and a moderately doped first Si layer, and forms a second wafer comprising a first silicon oxide layer and a second Si layer. The method bonds the first wafer to the second wafer, forming a SOI substrate. Then, a diode is formed with a p-n junction space charge region extending into the first Si substrate. A thin-film transistor (TFT) is formed in the second Si layer, and interconnects are formed between the TFT and the diode. For example, first Si substrate may have a resistivity of greater than 100 ohm-cm, and the first Si layer may have a dopant concentration in the range of about 1×1016 to about 5×1018 cm−3.
A method for forming a near infrared (NIR) active pixel sensor array on a silicon-on-insulator (SOI) substrate, the method comprising:
A method for forming a near infrared (NIR) active pixel sensor array on a silicon-on-insulator (SOI) substrate, the method comprising:
Dependencies are inferred from the claim text.