IBIS correction tool, IBIS correction method, and waveform simulation device

An IBIS correction method for converting IBIS data provided for a certain specific power supply voltage for a certain semiconductor device to corrected IBIS data corrected so as to match with a desired power supply voltage different from that specific power supply voltage for that semiconductor device, comprising:

• a first step of reading all data for an electrical characteristic of the output of said semiconductor device defined by said IBIS data as numerical data consisting of x-y coordinates;
• a second step of calculating a relative ratio between said numerical data consisting of the x-y coordinates read at said first step for said specific power supply voltage and numerical data represented on the same x-y coordinates for said desired power supply voltage as a correction coefficient;
• and
• a third step of converting the IBIS data corresponding to said specific power supply voltage to corrected IBIS data corrected so as to match with said desired power supply voltage according to said correction coefficient calculated at said second step.

A waveform simulation device comprising:

• a modeling unit receiving as input IBIS data and interconnect data provided from the outside and preparing a device model and an interconnect model;
• a waveform simulating unit receiving as input information of said device model and interconnect model prepared at said modeling unit and simulating an output waveform of a semiconductor device;
• and
• a waveform display unit for providing a simulated output waveform to a user, which
• forms a model generating unit including said modeling unit, introduces an IBIS correction tool to an input side of said IBIS data in the model generating unit, and has the IBIS correction tool convert IBIS data provided for a specific power supply voltage for a certain semiconductor device to corrected IBIS data corrected so as to match with a desired power supply voltage different from said specific power supply voltage for said specific semiconductor device.

A computer readable medium having a program stored therein to cause a computer to execute operations for converting IBIS data provoded for a specific power supply voltage for a specific semiconductor device to corrected IBIS data corrected sa as to match with a desired power supply voltage different from said specific power supply voltage for said specific semiconductor device, said operations comprising:

• reading all data for an electrical characteristic of the output of said semiconductor device defined by said IBIS data as numerical data consisting of x-y coordinates;
• calculating a relative ratio between said numerical data consisting of x-y coordinates read at said reading operation for said specific power supply voltage and numerical data represented on the same x-y coordinates for said desired power supply voltage as a correction coefficient;
• and
• converting the IBIS data corresponding to said specific power supply voltage to corrected IBIS data corrected so as to match with said desired power supply voltage according to said correction coefficient calculated at said calculating operation.