Method for Cleaning a Semiconductor Wafer
AssigneeInfineon Technologies AG
InventorSrivatsa Kundalgurki
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AssigneeInfineon Technologies AG
InventorSrivatsa Kundalgurki
Estimating the term…
Bottom electrodes of stacked capacitor DRAM cells are formed by depositing a metal layer on the side walls of trenches within a hard mask layer, which serves as a mold for the bottom electrode elements. Prior to depositing the hard mask layer a sacrificial first metal layer is disposed, which results in an electrically conductive surface on the semiconductor wafer. The mask layer is wet-etched to release the bottom electrode as free standing elements on the semiconductor surface. Using the conductive path provided by the first and the second metal layers, the bottom electrodes are polarized in a cleaning liquid bath during a wafer drying process. The generated repulsive electric field overcomes the attractive forces between the neighboring bottom electrode elements induced due to capillary effects of the liquids used for etching and cleaning.
A method for cleaning a semiconductor wafer having a plurality of metallic structures protruding from a surface of the semiconductor wafer, the method comprising:
A method for cleaning a semiconductor wafer having a plurality of metallic structures protruding from a surface of the semiconductor wafer, the method comprising:
A method for cleaning a semiconductor wafer having a plurality of elliptical electrodes protruding from a surface of the semiconductor wafer, the method comprising:
A method for fabricating electrodes of stacked capacitor memory cells on a semiconductor wafer, comprising:
Dependencies are inferred from the claim text.