Apparatus and methods for measuring shape of both sides of a plate
AssigneeToshiba Kikai Kabushiki Kaishi
InventorsSHIGETAKA AKIYAMA, SHINICHI TANAKA, TAKANOBU AKIYAMA, KATSUNOBU UEDA, YASUYUKI KITA
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AssigneeToshiba Kikai Kabushiki Kaishi
InventorsSHIGETAKA AKIYAMA, SHINICHI TANAKA, TAKANOBU AKIYAMA, KATSUNOBU UEDA, YASUYUKI KITA
Estimating the term…
In an apparatus for measuring shapes of both sides of a plate, a measuring apparatus body includes a reference plane of a longitudinal surface plate disposed in an almost vertical state at one end on a metallic bed, a holding mechanism for holding a plate to be measured in almost parallel therewith, and a displacement gauge scanning column. The displacement gauge scanning column includes a first air slide for mounting a first (second) displacement gauge and a second air slide for mounting a third displacement gauge, and is moved in a horizontal axis direction along a pair of V grooves. Moreover, the first (second) air slide is moved in a vertical axis direction. A shape of one of plate surfaces of the plate to be measured is measured by the scan of the first (second) displacement gauge, and at the same time, a shape of the other surface of the plate surface is measured by the scan of the third displacement gauge.
An apparatus for measuring shapes of both sides of a plate, comprising:
A method of measuring shapes of both sides of a plate, wherein a reference plane of a surface plate is disposed in an almost vertical state,
Dependencies are inferred from the claim text.