Methods for finding and characterizing a deformed pattern in an image

A method for characterizing a deformed pattern in an image, the method comprising:

• providing a plurality of features that represent the deformed pattern in the image;
• dividing the plurality of features into a plurality of sub-pluralities, each sub-plurality representing a sub-pattern in the image, a plurality of the sub-patterns representing the deformed pattern;
• determining a distance between each pair of sub-patterns of the plurality of sub-pluralities;
• locating a first sub-pattern in the image so as to provide a first sub-pattern location;
• locating a second sub-pattern in the image so as to provide a second sub-pattern location;
• and
• using the first sub-pattern location and the second sub-pattern location for determining a deformation mapping that characterizes the deformed pattern in the image.

A method for characterizing a deformed pattern in an image, the method comprising:

• dividing the deformed pattern into at least a first sub-pattern and a second sub-pattern;
• locating the first sub-pattern in the image so as to provide a first sub-pattern pose;
• locating the second sub-pattern in the image so as to provide a second sub-pattern pose;
• and
• using the first sub-pattern pose and the second sub-pattern pose for determining a deformation mapping that characterizes the deformed pattern in the image.