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US 2007/0183244 A1Published application
Electric fuse circuit providing margin read function
AssigneeSamsung Electronics Co., Ltd.
InventorByeong-Hoon Lee
Life of this patent
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Abstract
An electric fuse circuit including a first nonvolatile memory cell connected to a first bit line, a second nonvolatile memory cell connected to a second bit line, a latch connected to the first and second bit lines, and a bias current circuit supplying one of the first and second bit lines with variable bias currents through the latch in response to a bias control signal during a test operation.
Claims10
An electric fuse circuit comprising:
- a first nonvolatile memory cell connected to a first bit line;
- a second nonvolatile memory cell connected to a second bit line;
- a latch connected to the first and second bit lines;
- and
- a bias current circuit supplying one of the first and second bit lines with variable bias currents through the latch in response to a bias control signal during a test operation.
2 more elements
Dependencies are inferred from the claim text.