Semiconductor memory device having reduced voltage coupling between bit lines
AssigneeSamsung Electronics Co., Ltd.
InventorsGong-Heum Han, Chul-Sung Park, Hyung-Jin Kim, Byeong-Uk Yoo
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AssigneeSamsung Electronics Co., Ltd.
InventorsGong-Heum Han, Chul-Sung Park, Hyung-Jin Kim, Byeong-Uk Yoo
Estimating the term…
An enhanced semiconductor memory device capable of eliminating or minimizing a cell data flip phenomenon caused by capacitive voltage coupling between bit lines in different bit line pairs. Each memory cell is connected to a word line and between a pair of bit line. A first precharging and equalizing circuit us connected to a first bit line pair and a second precharging and equalizing circuit us connected to an adjacent second bit line pair. The first and second precharging and equalizing circuit are activated independently and at different times in order to reduce voltage coupling between neighboring bit lines in different bit line pairs, thereby minimizing or eliminating a cell data flip phenomenon of a neighboring memory cell caused by voltage coupling between bit lines.
A semiconductor memory device, comprising:
A semiconductor memory device, comprising:
A static random access semiconductor memory device, comprising:
A method for performing a write operation in a semiconductor memory device comprising a first memory cell connected to a first word line and between a first pair of bit lines and a second memory cell connected to the first word line and between a second pair of bit lines, the method comprising:
A method for performing write operation in a semiconductor memory device comprising an array of memory cells, each memory cell having three-dimensional stack and being connected to a word line and between a pair of bit lines, the method comprising:
Dependencies are inferred from the claim text.