US 2007/0183029 A1 · Microscope and its optical controlling method

Abstract

Microscope and its optical controlling method capable of making an optical adjustment of first and second lights being made in easy with high accuracy, and capable of developing the effect of the superresolution and expected optical performance surely, is provided. The microscope comprises first deflection means 14a and 14b for deflecting the first light from the first light source 11 that excites the molecule included in the specimen 74 from the ground-state to the first electronically excited state, two dimensionally second deflecting means 7a, 17b for deflecting a second light from a second light source 12 to excite the molecule from the first electron exciting state to the second electron exciting state with more higher energy level, two dimensionally, a combining means 16 for synthesizing deflected first light and second light on the same optical axis or on the mutually parallel optical axis, and third deflection means 19a, 19b for deflecting the synthesized first light and the second light simultaneously, wherein the luminescence is detected, by adjusting the optical axes of the first light to the third light by the first to third deflection means, and by overlapping part of these lights by the beam-condensing optical system 72 and irradiating them on the specimen 74.

Claims17

Dependent claims

A microscope for detecting luminescence generated from a specimen by irradiating and overlapping parts of a first light from a first light source for exciting a molecule from a ground-state to first electron exciting state to the specimen containing the molecule with three electronic states including at least a ground-state, a second light from a second light source for exciting the molecule from the first electron exciting state to the second electron exciting state with more higher energy level, by a beam-condensing optical system, comprising;

a first deflection means for deflecting the first light from the first light source two dimensionally,
a second deflection means for deflecting the second light from the second light source two dimensionally,
a combining means for synthesizing first light deflected by the first deflection means and second light deflected by the second deflection means on the same optical axis or on parallel optical axis to each other so as to progress the lights in the same direction, and
a third deflection means for deflecting the first light and the second light which are synthesized by the combining means simultaneously.

1 more element

An optical controlling method of microscope for detecting luminescence generated from a specimen by irradiating and overlapping parts of a first light from a first light source for exciting a molecule from a ground-state to first electron exciting state to the specimen containing the molecule with three electronic states including at least a ground-state, a second light from a second light source for exciting the molecule from the first electron exciting state to the second electron exciting state with more higher energy level, by a beam-condensing optical system, comprising;

a first deflection means for deflecting the first light from the first light source two dimensionally,
a second deflection means for deflecting the second light from the second light source two dimensionally,
a combining means for synthesizing first light deflected by the first deflection means and second light deflected by the second deflection means on the same optical axis or on parallel optical axis to each other so as to progress the lights in the same direction, and
a third deflection means for deflecting the first light and the second light which are synthesized by the combining means simultaneously,
an observation means for observing the beam-condensing state of the first light and the second light on the focal plane of the beam-condensing optical system, characterized by comprising
a step of adjusting the optical axis of the first light and the optical axis of the second light independently by the first deflection means and the second deflection means, while observing the focal plane with the observation means by locating the reflection member on the focal plane of the beam-condensing optical system, and
a step of performing the positioning of the first light and the second light on the focal plane, by adjusting the optical axis of the first light and the optical axis of the second light by the third deflection means simultaneously.

4 more elements

Dependencies are inferred from the claim text.

Microscope and its optical controlling method

Life of this patent

Microscope and its optical controlling method

Life of this patent

Abstract

Claims17