Detector circuit for detecting an external manipulation of an electrical circuit, circuit arrangement comprising a plurality of detector circuits, memory device and method for operating a detector circuit
AssigneeInfineon Technologies AG
InventorTHOMAS KUNEMUND
Life of this patent
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Abstract
A detector circuit for detecting an external manipulation of an electrical circuit. The detector circuit includes a digital circuit which is sensitive to at least one of the effects of ionizing radiation or fluctuations of a supply voltage, and the output state of the digital circuit is indicative of an attack.
Claims22
A detector circuit for detecting an external manipulation of an electrical circuit comprising a digital circuit having a first state and a second state, wherein the digital circuit is sensitive to at least one of the effects of ionizing radiation and fluctuations of a supply voltage, and an output state of the digital circuit is indicative of an attack.
A detector circuit for detecting an external manipulation of an electrical circuit comprising a flip-flop circuit having a first state and a second state, wherein the flip-flop is a reset-set latch comprising a reset input, a set input and at least one output node, and the latch comprises:
- a first transistor of a first conductivity type, the gate terminal of which is connected to the set input and the source terminal of which is connected to the reset input;
- a second transistor of the first conductivity type, the drain terminal of which is connected to the drain terminal of the first transistor and the source terminal of which is connected to the source terminal of the first transistor;
- a third transistor of a second conductivity type, the drain terminal of which is connected to the drain terminal of the first transistor and the source terminal of which is connected to a first supply voltage potential;
- a fourth transistor of the first conductivity type, the gate terminal of which is connected to the source terminal of the first transistor, the source terminal of which is connected to a second supply voltage potential and the drain terminal of which is connected to the gate terminal of the second transistor, the gate terminal of the third transistor and also the output node;
- a fifth transistor of the second conductivity type, the source terminal of which is connected to the first supply voltage potential and the gate terminal of which is connected to the reset input;
- a sixth transistor of the second conductivity type, the source terminal of which is connected to the drain terminal of the fifth transistor, the drain terminal of which is connected to the output node and the gate terminal of which is connected to the drain terminal of the first transistor;
- and
- a seventh transistor of the first conductivity type, the drain terminal of which is connected to the output node, the source terminal of which is connected to the second supply voltage potential and the gate terminal of which is connected to the gate terminal of the sixth transistor.
A circuit arrangement comprising a network with a plurality of detector circuits for detecting an external manipulation of an electrical circuit, each of the detector circuits comprising a digital circuit having a first state and a second state, wherein the digital circuit is sensitive to at least one of the effects of ionizing radiation and fluctuations of a supply voltage, and an output state of the digital circuit is indicative of an attack.
A circuit arrangement comprising a plurality of detector circuits for detecting an external manipulation of an electrical circuit, each of the detector circuits comprising a flip-flop circuit having a first state and a second state, the flip-flop circuit being a reset-set latch comprising a reset input, a set input and at least one output node, the latch comprising:
- a first transistor of a first conductivity type, the gate terminal of which is connected to the set input and the source terminal of which is connected to the reset input;
- a second transistor of the first conductivity type, the drain terminal of which is connected to the drain terminal of the first transistor and the source terminal of which is connected to the source terminal of the first transistor;
- a third transistor of a second conductivity type, the drain terminal of which is connected to the drain terminal of the first transistor and the source terminal of which is connected to a first supply voltage potential;
- a fourth transistor of the first conductivity type, the gate terminal of which is connected to the source terminal of the first transistor, the source terminal of which is connected to a second supply voltage potential and the drain terminal of which is connected to the gate terminal of the second transistor, the gate terminal of the third transistor and also the output node;
- a fifth transistor of the second conductivity type, the source terminal of which is connected to the first supply voltage potential and the gate terminal of which is connected to the reset input;
- a sixth transistor of the second conductivity type, the source terminal of which is connected to the drain terminal of the fifth transistor, the drain terminal of which is connected to the output node and the gate terminal of which is connected to the drain terminal of the first transistor;
- and
- a seventh transistor of the first conductivity type, the drain terminal of which is connected to the output node, the source terminal of which is connected to the second supply voltage potential and the gate terminal of which is connected to the gate terminal of the sixth transistor.
A memory device comprising a plurality of memory cells and a network comprising a plurality of detector circuits being arranged in a distributed manner between the memory cells, wherein each of the detector circuits comprises a digital circuit having a first state and a second state, the digital circuits being sensitive to at least one of the effects of ionizing radiation and fluctuations of a supply voltage.
A method for operating a detector circuit for detecting an external manipulation of an electrical circuit comprising at least one digital circuit having a first state and a second state, the method comprising:
- initializing the detector circuits into the first state;
- evaluating the state of the detector circuits;
- and
- generating an alarm signal if at least one of the detector circuits has the second state.
A device for operating a detector circuit for detecting an external manipulation of an electrical circuit comprising at least one digital circuit having a first state and a second state, the device comprising:
- means for initializing the detector circuits into the first state;
- means for evaluating the state of the detector circuits;
- and
- means for generating an alarm signal if at least one of the detector circuits has the second state.
Dependencies are inferred from the claim text.