Built-in self test method for a digitally controlled crystal oscillator

A built-in self test method of testing a digitally controlled crystal oscillator (DCXO) comprising a capacitor matrix organized as a plurality of rows and columns and incorporating dynamic element matching (DEM), said method comprising the steps of:

• testing said capacitor matrix on a row by row basis, wherein each row of capacitors is tested as a single unit;
• and
• indicating a test failure if the results of a row test is not with a predetermined specification.

A method of testing a plurality of capacitors, for use in a digitally controlled oscillator (DCO) incorporating dynamic element matching (DEM), said method comprising the steps of:

• performing testing of groups of said capacitors, wherein each group of capacitors is tested as a single entity;
• and
• analyzing results of each test against expected frequency characteristics of an entire group of capacitors combined.

A method of testing a plurality of digitally-controlled conversion devices in a circuit incorporating dynamic element matching (DEM), said method comprising the steps of:

• performing testing of groups of said digitally-controlled conversion devices, wherein each group of said digitally-controlled conversion devices is tested as a single entity;
• and
• analyzing results of each test against expected characteristics of an entire group of digitally-controlled conversion devices combined.