Pulsed methods and systems for measuring the resistance of polarizing materials
AssigneeOnset Computer Corporation
InventorLon Hocker
Life of this patent
Estimating the term…
Loading patent…
AssigneeOnset Computer Corporation
InventorLon Hocker
Estimating the term…
A system and method for measuring resistance of a polarizing material are disclosed. The system includes a voltage divider circuit having a first resistive element of known resistance and the polarizing material of unknown resistance and a processing unit. The processing unit is electrically-coupled to the voltage divider circuit and adapted to apply a voltage across the voltage divider circuit. A first input/output (I/O) pin is electrically-coupled between the processing unit and the first resistive element. A second pin is electrically-coupled between the processing unit and a junction between the polarizing material and the first resistive element. A controller is adapted to cause the second pin to short the polarizing material after a measurement is completed, to bleed off any residual polarization from the capacitive element of the polarizing material.
A system for measuring resistance of a polarizing material, the system comprising:
A method for measuring resistance of a polarizing material, the method comprising:
A method for measuring resistance of a polarizing material, the method comprising:
Dependencies are inferred from the claim text.