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US 2007/0182424 A1Published application
High frequency circuit analyser
AssigneeUniversity College Cardiff Consultants Limited
InventorsJohannes Benedikt, Paul Tasker
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AssigneeUniversity College Cardiff Consultants Limited
InventorsJohannes Benedikt, Paul Tasker
Estimating the term…
An analyzer for measuring the response of an electronic device (DUT 206) to an RF input signal from a signal generator (240a) is described. An active load pull circuit (201) is connected to the DUT 206, which receives an output signal from the DUT 206 and then feeds a modified signal back to the DUT 206. The signal is modified by a signal processing circuit (237) in view of input signals x, y to control the magnitude gain and phase change effected by the feedback circuit (237). Thus, positive feedback loops are avoided and better control of the analyzer is permitted. A network analyzer, or other signal measuring device (242), logs the waveforms (from which s-parameters derived) observed at ports of the DUT 206, thereby allowing the behaviour of the DUT 206 under various load conditions to be analyzed.
An analyzer for measuring at frequencies within a frequency range the response of an electronic device to a high frequency input signal, the analyzer including:
An active load pull circuit for use in an analyzer for measuring at frequencies within a frequency range the response of an electronic device to a high frequency input signal, the active load pull circuit being connectable in use to a device to be analyzed and including a feedback circuit arranged to receive an output signal from the device to be analyzed, to modify the signal and to feed the modified signal back to the device to be analyzed, wherein the feedback circuit is arranged to limit the magnitude gain of the feedback circuit at all frequencies within the frequency range.
A method of measuring the response of an electronic device to a high frequency input signal, the method including the steps of:
An analyzer for measuring at frequencies within a frequency range the response of an electronic device to a high frequency input signal, the analyzer including:
An analyzer for measuring the response of an electronic device to a high frequency input signal, the analyzer including:
Dependencies are inferred from the claim text.