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US 2007/0182422 A1Published application
Probe for electrical measurement methods, especially eddy current measurements
AssigneeSiemens Aktiengesellschaft
InventorsLudwig Bar, Werner Heinrich
Life of this patent
Estimating the term…
Abstract
Disclosed is a probe which is configured in a flexible manner by means of a flexible substrate so as to be adjustable to different radii of curvature of a test piece. The lining is also embodied in an elastic manner.
Claims12
1-11. (canceled)
An eddy current probe for electrical measurement methods, comprising:
- a substrate with a resting surface and the resting surface comes to lie on a test piece;
- two electrical components mounted on the substrate such that the probe with the substrate is flexible and the probe with the substrate can adapt itself to a different radii of curvature of the test piece;
- a backing with a ferritic and/or magnetic material that at least partly covers at least one electrical component and is formed elastically;
- an exciter coil as a first electrical component;
- and
- a signal coil as the second electrical component,
- wherein the exciter coil encloses a coil section of the signal coil and the signal coil and the exciter winding lie in one plane or on a surface of the substrate.
4 more elements
Dependencies are inferred from the claim text.