Semiconductor device and method of manufacture thereof
OwnerKota Oikawainventor
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OwnerKota Oikawainventor
Estimating the term…
The semiconductor device of present invention is provided with an impurity diffusion region formed in the surface part of a semiconductor layer and a metal silicide layer formed in the surface part of the impurity diffusion region. An interlayer insulating film is formed on the metal silicide layer, and a contact plug that passes through the interlayer insulating film and is electrically connected with the metal silicide layer is formed. The contact plug passing through the interlayer insulating film is formed in a region where the metal silicide layer has a sufficient film thickness, and a recess is formed in the metal silicide layer at the contact hole bottom. Moreover, the contact plug has a projection fitting to the recess of the metal silicide layer in a part of a contact surface with the metal silicide layer.
A semiconductor device provide with an impurity diffusion region formed in the surface part of a semiconductor layer, a metal silicide layer formed at the surface of the impurity diffusion region and a contact plug that passes through an interlayer insulating film formed on the metal silicide layer and is electrically connected with the metal silicide layer, comprising:
A manufacturing method of semiconductor device provided with a contact plug electrically connected to an impurity diffusion region in the surface part of a semiconductor layer via a metal silicide layer, comprising the steps of:
Dependencies are inferred from the claim text.