Mass spectrometer and mass spectrometry
AssigneeHitachi, Ltd.
InventorsMasuyoshi Yamada, Masao Suga, Izumi Waki
Life of this patent
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Abstract
A mass spectrometer capable of measuring under switching two ion sources at different pressure levels in which a sample gas separated by GC column is branched, and separately introduced to a first ion source (for example, APCI ion source) and a second ion source (for example, EI ion source) at a pressure level lower than that of the first ion source respectively. Preferably, the flow rate of the sample gas introduced to the APCI ion source is made more than the flow rate of the sample gas introduced to the EI ion source, so that the pressure for each of the ion sources can be maintained and analysis can be conducted by each ionization at a good balance in view of the sensitivity.
Claims8
A mass spectrometry comprising the steps of:
- separating a sample separated by gas chromatography into a first path and a second path;
- introducing the sample in the first path into the first sample ion source, and introducing the sample in the second path into the second sample ion source situated downstream of the first sample ion source in the moving direction of the ions of the first sample ion source;
- turning-on the first sample ion source while turning-off the second sample ion source and ionizing the sample ingredient eluted from the first path by the first sample ion source thereby measuring the mass spectrum;
- turning-off the first sample ion source and turning-on the second sample ion source;
- and
- ionizing the sample ingredient eluted from the second path by the second sample ion source, thereby measuring mass spectrum.
Dependencies are inferred from the claim text.