Mass spectrometer and mass spectrometry
AssigneeHitachi, Ltd.
InventorsMasuyoshi Yamada, Masao Suga, Izumi Waki
Life of this patent
Estimating the term…
Abstract
A mass spectrometer capable of measuring under switching two ion sources at different pressure levels in which a sample gas separated by GC column is branched, and separately introduced to a first ion source (for example, APCI ion source) and a second ion source (for example, EI ion source) at a pressure level lower than that of the first ion source respectively. Preferably, the flow rate of the sample gas introduced to the APCI ion source is made more than the flow rate of the sample gas introduced to the EI ion source, so that the pressure for each of the ion sources can be maintained and analysis can be conducted by each ionization at a good balance in view of the sensitivity.
Claims9
A mass spectrometer comprising:
- a first sample ion source;
- a second sample ion source disposed to the downstream of the first sample ion source relative to the moving direction of the ions of the first sample ion source and at a pressure lower than that of the first sample ion source;
- and
- mass spectrometric part disposed downstream of the second sample ion source to the moving direction of the ions of the second sample ion source, wherein a first sample introduction port branched from a sample introduction channel is disposed to the first sample ion source and a second sample introduction port branched from the sample introduction channel is disposed to the second sample ion source.
9-16. (canceled)
Dependencies are inferred from the claim text.