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US 2007/0181431 A1Published application
Methods and Apparatus for Monitoring Deposition Quality During Conformable Contact Mask Plating Operations
AssigneeUniversity of Southern California
InventorsGang Zhang, Adam Cohen
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Abstract
Electrochemical fabrication (e.g. EFAB) processes and apparatus are disclosed that provide monitoring of at least one electrical parameter (e.g. voltage) during selective deposition where the monitored parameter is used to help determine the quality of the deposition that was made. If the monitored parameter indicates that a problem occurred with the deposition, various remedial operations may be undertaken to allow successful formation of the structure to be completed.
Claims12
An electrochemical fabrication process for producing a three-dimensional structure, the process comprising:
- (A) selectively depositing at least at least one of a first structural material or a first sacrificial material to form a portion of a first layer on a substrate, wherein the substrate may comprise previously deposited material;
- (B) depositing the other of the first structural material or the first sacrificial material to form another portion of the first layer;
- (C) forming a plurality of layers, each comprising at least one sacrificial material, which may or may not be different from the first sacrificial material, and at least one structural material, which may or may not be different from the first structural material, such that successive layers are formed adjacent to and adhered to previously formed layers, wherein said forming comprises repeating (A) and (B) a plurality of times;
- wherein monitoring of an electrical parameter during deposition, manual visual inspection of deposited material, or automatic visual inspection of deposited material occurs to detect if a problem occurred;
- and
- wherein at least one of the first or plurality of layers is at least partially removed after at least partial formation of the at least one layer and then the at least one layer is reformed if the problem is detected.
3 more elements
Dependencies are inferred from the claim text.