Compositions and methods for CMP of phase change alloys
AssigneeCabot Microelectronics Corporation
InventorsJeffrey Dysard, Paul Feeney, Sriram Anjur
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AssigneeCabot Microelectronics Corporation
InventorsJeffrey Dysard, Paul Feeney, Sriram Anjur
Estimating the term…
The present invention provides a chemical-mechanical polishing (CMP) composition suitable for polishing a substrate comprising a phase change alloy (PCA), such as a germanium-antimony-tellurium (GST) alloy. The composition comprises not more than about 6 percent by weight of a particulate abrasive material in combination with an optional oxidizing agent, at least one chelating agent, and an aqueous carrier therefor. The chelating agent comprises a compound or combination of compounds capable of chelating a phase change alloy or component thereof (e.g., germanium, indium, antimony and/or tellurium species) that is present in the substrate, or chelating a substance that is formed from the PCA during polishing of the substrate with the CMP composition. A CMP method for polishing a phase change alloy-containing substrate utilizing the composition is also disclosed.
A chemical-mechanical polishing (CMP) composition for polishing a phase change alloy-containing substrate, the composition comprising:
A chemical-mechanical polishing (CMP) method for polishing a phase change alloy-containing substrate, the method comprising the steps of:
Dependencies are inferred from the claim text.