Magnetic tunnel junction device with improved barrier layer
AssigneeEverspin Technologies, Inc.
InventorsJiJun Sun, John Martin, Jon Slaughter
Life of this patent
Estimating the term…
Loading patent…
AssigneeEverspin Technologies, Inc.
InventorsJiJun Sun, John Martin, Jon Slaughter
Estimating the term…
Methods and apparatus are provided for magnetic tunnel junction (MTJ) devices and arrays, comprising metal-insulator-metal (M-I-M) structures with opposed first and second ferro-magnetic electrodes with alterable relative magnetization direction. The insulator is formed by depositing an oxidizable material (e.g., Al) on the first electrode, naturally oxidizing it, e.g., at about 0.03 to 10 milli-Torr for up to a few thousand seconds at temperatures below about 35° C., then further rapidly (e.g., plasma) oxidizing at a rate much larger than that of the initial natural oxidation. The second electrode of the M-I-M structure is formed on this oxide. More uniform tunneling properties result. A second oxidizable material layer is optionally provided after the initial natural oxidation and before the rapid oxidation step during which it is substantially entirely converted to insulating oxide. A second natural oxidation cycle may be optionally provided before the second layer is rapidly oxidized.
A method for forming an array of magnetic tunnel junction (MTJ) devices, comprising:
A method for forming an array of magnetic tunnel junction (MTJ) devices, comprising:
A method for forming a metal-insulating-metal tunneling structure of a magnetic tunnel junction device, comprising:
Dependencies are inferred from the claim text.