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US 2007/0178330 A1Published application
Thin wear resistent coating
AssigneeSeco Tools AB
InventorsJacob Sjolen, Tommy Larsson, Lennart Karlsson
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AssigneeSeco Tools AB
InventorsJacob Sjolen, Tommy Larsson, Lennart Karlsson
Estimating the term…
The present invention relates to a cutting tool insert, solid end mill, or drill, comprising a substrate and a coating. The coating is composed of one or more layers of refractory compounds of which at least one layer comprises a h-Me1Me2X phase, where Me1 is one or several of the elements V, Cr, Nb, and Ta and Me2 is one or several of the elements Ti, Zr, Hf, Al, and Si and X is one or several of the elements N, C, O or B. The ratio R=(at-% X)/(at-% Me1+at-% Me2) of the h-MelMe2X phase is between 0.5 and 1.0, preferably between 0.8 and 1.0 and X contains less than 30 at-% of O+B. This invention is particularly useful in metal cutting applications where the chip thickness is small and the work material is hard e.g. copy milling using solid end mills, insert milling cutters or drilling of hardened steels.
Cutting tool insert, solid end mill, or drill, comprising a substrate and a coating composed of one or more layers of refractory compounds of wherein at least one layer comprises crystalline hexagonal phase, h-(Me1,Me2)X, described with the composition Me1aMe21-aXb where Me1 is one or several of the elements V, Cr, Nb, and Ta and Me2 is one or several of the elements Ti, Zr, Hf, Al, and Si and a >0.5 and X one or several of the elements N, C, O and B, the ratio R=(at-% X)/(at-% Me1+at-% Me2) of the Me1aMe21-aXb phase is between 0.5 and 1.0, preferably between 0.75 and 1.0, and that X contains less than 30 at-% of O+B, the X-ray diffraction (XRD) pattern in θ-2θ and/or gracing incidence geometry from the crystalline hexagonal phase, h-(Me1,Me2)X, showing one or several of the following peaks:
Method of producing a coated cutting tool insert, solid end mill, or drill, comprising a substrate and a coating wherein the coating is composed of one or more layers of refractory compounds of which at least one layer comprises a h-(Me1,Me2)X phase described with the composition Me1aMe21-aXb where Me1 is one or several of the elements V, Cr, Nb, and Ta and Me2 is one or several of of the elements Ti, Zr, Hf, Al, and Si and a >0.5 and X one or several of the elements N, C, O and B and that the ratio R=(at-% X)/(at-% Me1+at-% Me2) of the Me1aMe21-aXb phase, is between 0.5 and 1.0, preferably between 0.75 and 1.0 and that X contains less than 30 at-% of O+B.
Dependencies are inferred from the claim text.